Lehigh University
COLLEGE HOME | LEHIGH HOME | SEARCH




   

CSE 326 Pattern Recognition (3)

Instructor: Henry Baird

Current Catalog Description


Bayesian decision theory and the design of parametric classifiers: linear (perceptrons), quadratic, nearest-neighbors, neural nets.  Machine learning techniques: boosting, bagging.  High-performance machine vision systems: segmentation, contextual analysis, adaptation.  Students carry out projects, e.g. on digital libraries and vision-based Turing tests.  Credit will not be given for both CSE 326 and CSE 426.  Prerequisites: CSE 109, CSE 340, Math 205, and Math 231, or consent of instructor.

     
image


©2008 P.C. Rossin College of Engineering & Applied Science
Computer Science & Engineering, Packard Laboratory, Lehigh University, Bethlehem PA 18015